Rtec Instruments provides several solutions to evaluate touch screens, devices,  organic layers, coatings,  PCB,  consumer goods, and more.

Home > Lösungen > Halbleiter

Solutions We Offer

So many choices. So much data. Our instruments investigate and yield comprehensive analysis for every stage of semiconductor production and quality control.

scratch data images and analysis by rtec instruments

Scratch Adhesion, Hardness

Mechanical properties for the semiconductor industry are important as it helps to quantify whether a functional layer adheres to the substrates or if the property varies between different areas and devices. Study scratch adhesion, scratch hardness, and scratch resistance at nano and micro scale. In-line integrated nm resolution 3D profilometer provides 3D stitched images to comprehensively and conclusively characterize the coating failures.

Friction, Durability, Wear Resistance, Perception, Touch

Characterize friction, durability, and wear of coatings, touch screens, optical surfaces, consumer goods, and lenses with various multi level coatings. Quantify perception, touch, static, and dynamic coefficient of friction under wide test parameters, motion, and controlled environmental conditions. 

nano tribology of thin films using tribometer
phone flat and curved screen

Curved and Flat Screen Surfaces

Characterize the roughness, defects, scratches, and features using our unique optics technology. Study transparent, curved, or flat screens and glass surfaces with ease. In addition, study coating adhesion on surfaces or devices with our scratch tester.


Increase the yield and process efficiency by avoiding stripping and remounting pellicles. Test the position of the particles on pellicle. The unique technology allows quantification and finds if particles are below or above pellicle surface.

pellicle defectivity analysis profilometer
CMP Platen for CMP tester

Chemical Polishing

Study and characterize the CMP process like never before. In addition to polishing wafers & substrates, the tester comes with in-line surface profilometer.

3D Imaging

The unique all-in-one universal profiler combines  4 imaging modes (confocal, interferometer, dark field and bright field) on one head. This is very beneficial for semicon industry as advantages from all techniques are available to use together seamlessly. Few industry standard applications include particle on pellicle, highest XY dimension resolution on devices, and imaging transparent screen surfaces in one instrument.

3D wafer surface profile by Rtec Instruments 3D optical profilometer

Semiconductor Testing In Action

Watch as we demonstrate how our instruments can fulfill all of your needs

Möchten Sie mehr erfahren?

Kontaktieren Sie uns und fordern Sie eine Demonstration an.

© Copyright 2021 Rtec-Instruments - All Rights Reserved