Semiconductor

Rtec Instruments provides several solutions to evaluate touch screens, devices, organic layers, coatings, PCB, consumer goods, and more.

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Solutions We Offer

So many choices. So much data. Our instruments investigate and yield comprehensive analysis for every stage of semiconductor production and quality control.

scratch data images and analysis by rtec instruments

Scratch Adhesion, Hardness

Mechanical properties for the semiconductor industry are important as it helps to quantify whether a functional layer adheres to the substrates or if the property varies between different areas and devices. Study scratch adhesion, scratch hardness, and scratch resistance at nano and micro scale. In-line integrated nm resolution 3D profilometer provides 3D stitched images to comprehensively and conclusively characterize the coating failures.

Indentation and Scratch Tester, SMT-5000

Friction, Durability, Wear Resistance, Perception, Touch

Characterize friction, durability, and wear of coatings, touch screens, optical surfaces, consumer goods, and lenses with various multi level coatings. Quantify perception, touch, static, and dynamic coefficient of friction under wide test parameters, motion, and controlled environmental conditions.

Multi Function Tribometer, MFT-5000

nano tribology of thin films using tribometer

Curved and Flat Screen Surfaces

Characterize the roughness, defects, scratches, and features using our unique optics technology. Study transparent, curved, or flat screens and glass surfaces with ease. In addition, study coating adhesion on surfaces or devices with our scratch tester.

3D Optical Profilometers, UP Series

Indentation and Scratch Tester, SMT-5000

Pellicles

Increase the yield and process efficiency by avoiding stripping and remounting pellicles. Test the position of the particles on pellicle. The unique technology allows quantification and finds if particles are below or above pellicle surface.

3D Optical Profilometers, UP Series

pellicle defectivity analysis profilometer

Chemical Polishing

Study and characterize the CMP process like never before. In addition to polishing wafers & substrates, the tester comes with in-line surface profilometer.

CMP Tester, CP-6

3D Imaging

The unique all-in-one universal profiler combines 4 imaging modes (confocal, interferometer, dark field and bright field) on one head. This is very beneficial for semicon industry as advantages from all techniques are available to use together seamlessly. Few industry standard applications include particle on pellicle, highest XY dimension resolution on devices, and imaging transparent screen surfaces in one instrument.

3D Optical Profilometers, UP Series