Spectral Film Thickness Tester

The Rtec-Instruments Spectral Film Thickness Tester delivers fast, accurate, and non-contact measurement of thin film thickness using spectral reflectance technology.

By analyzing the wavelength-dependent reflection of light from thin-film interfaces, the system precisely determines film thickness and optical properties without damaging the sample.

It is ideal for single-layer and multilayer coatings used in semiconductor, optics, electronics, photovoltaic, and advanced materials applications, providing rapid, repeatable measurements for quality control and research.