Rtec Instruments provides several solutions to evaluate touch screens, devices, organic layers, coatings, PCB, consumer goods, and more.
Solutions We Offer
So many choices. So much data. Our instruments investigate and yield comprehensive analysis for every stage of semiconductor production and quality control.
Scratch Adhesion, Hardness
Mechanical properties for the semiconductor industry are important as it helps to quantify whether a functional layer adheres to the substrates or if the property varies between different areas and devices. Study scratch adhesion, scratch hardness, and scratch resistance at nano and micro scale. In-line integrated nm resolution 3D profilometer provides 3D stitched images to comprehensively and conclusively characterize the coating failures.
Friction, Durability, Wear Resistance, Perception, Touch
Characterize friction, durability, and wear of coatings, touch screens, optical surfaces, consumer goods, and lenses with various multi level coatings. Quantify perception, touch, static, and dynamic coefficient of friction under wide test parameters, motion, and controlled environmental conditions.
Curved and Flat Screen Surfaces
Characterize the roughness, defects, scratches, and features using our unique optics technology. Study transparent, curved, or flat screens and glass surfaces with ease. In addition, study coating adhesion on surfaces or devices with our scratch tester.
Increase the yield and process efficiency by avoiding stripping and remounting pellicles. Test the position of the particles on pellicle. The unique technology allows quantification and finds if particles are below or above pellicle surface.
Study and characterize the CMP process like never before. In addition to polishing wafers & substrates, the tester comes with in-line surface profilometer.
The unique all-in-one universal profiler combines 4 imaging modes (confocal, interferometer, dark field and bright field) on one head. This is very beneficial for semicon industry as advantages from all techniques are available to use together seamlessly. Few industry standard applications include particle on pellicle, highest XY dimension resolution on devices, and imaging transparent screen surfaces in one instrument.
Semiconductor Testing In Action
Watch as we demonstrate how our instruments can fulfill all of your needs
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